Haugstad, Greg Atomic Force Microscopy : understanding Basic Modes and Advanced Applications / Greg Haugstad. -- Hoboken : John Wiley & Sons, 2012. -- xxii, 464 s. : obr., tab., 4 príl. ; 24 cm. -- ISBN 978-0-470-63882-8 (viaz.) : 118,72 Eur

57.086.2/.3+620.172.24+539.1
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