Vytlačiť
1. Analysis of coating system using the scanning electron microscopy (SEM)
Analysis of coating system using the scanning electron microscopy (SEM) abstract
Betáková Zuzana TUZDFNOD - Katedra náuky o dreve
Mamoňová Miroslava TUZDFNOD - Katedra náuky o dreve
Microscopy conference 2021 : joint meeting of Dreiländertagung & multinational congress on microscopy, 22-26 August 2021 : proceedings. P. 186-187 [pdf]. - [Wien] : [Technische Universität Wien], 2021
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